The influence of dislocations on the electrical properties of MOS field effect transistors

Publication Year:
1974
Usage 133
Abstract Views 133
Repository URL:
http://hdl.handle.net/1969.1/ETD-TAMU-1974-THESIS-R217
Author(s):
Raphael, Fouad Antoine
Publisher(s):
Texas A&M University
Tags:
electrical engineering.; Major electrical engineering.
thesis / dissertation description
Not available