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The optical properties of CuGaInSe thin films

Journal of Materials Science, ISSN: 0022-2461, Vol: 26, Issue: 12, Page: 3191-3196
1991
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  • Citations
    10
    • Citation Indexes
      10
  • Captures
    1

Article Description

CuGaInSe thin films with thickness in the range 50 to 280 nm were deposited by thermal evaporation of prereacted material on glass substrates. The films were found to be polycrystalline with single phase having chalcopyrite structure as that of bulk material. The optical constants of these films were determined by transmittance and reflectance measurements at normal incidence for light in the wavelength range 400 to 1200 nm. Three characteristic energy gaps of 1.30, 1.55 and 2.46 eV were obtained from an analysis of the optical absorption spectrum. The optical constants of the films appear to be independent of the substrate temperature. © 1991 Chapman and Hall Ltd.

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