Electromagnetic emission of integrated circuits induced by ionizing radiation and its measurement uncertainties
Elektrotechnik und Informationstechnik, ISSN: 0932-383X, Vol: 141, Issue: 1, Page: 56-65
2024
- 1Citations
- 1Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
In this article, we show the change of electromagnetic emission (EME) of integrated circuits (ICs) and their external circuitry induced by the presence of ionizing radiation. We use the 150 Ohm method according to IEC 61967‑4 to characterize the conducted emission of our tested integrated circuit (IC) at the VDD pin. Simultaneously to measuring the electromagnetic emission, we irradiate the IC with X‑rays. The irradiation process is carried out up to a dose of 5 Mrad using a high-power X‑ray radiation source. The electromagnetic emission spectra are retrieved before, during and after the irradiation process. We also show that special caution regarding radio frequency (RF) measurements must be used when performing combined testing. Therefore, we analyze the composition of measurement uncertainties of electromagnetic compatibility in combination with ionizing radiation hardness characterization. This article contains measurement results showing the negative impact of ionizing radiation on the electromagnetic compatibility (EMC) of an IC. Additionally we provide measures to ensure properly combined measurements of EME and ionizing radiation. Therefore we show how to reduce the electromagnetic interference originating from the high-voltage generator that is necessary to generate X‑rays.
Bibliographic Details
Springer Science and Business Media LLC
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know