PlumX Metrics
Embed PlumX Metrics

Field Emission Properties of Nano-DLC Films Prepared on Cu Substrates by Pulsed Laser Deposition

Journal Wuhan University of Technology, Materials Science Edition, ISSN: 1993-0437, Vol: 33, Issue: 2, Page: 326-330
2018
  • 5
    Citations
  • 0
    Usage
  • 5
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

Article Description

Nano-diamond like carbon (DLC) thin films were prepared on fused silica and Cu substrates by the pulsed-laser deposition technique with different laser intensities. Step-measurement, atomic force microscope (AFM), UV-VIS-NIR transmittance spectroscopy and Raman spectroscopy were used to characterize the films. It was shown that the deposition rate increases with the laser intensity, and the films prepared under different laser intensities show different transparency. Raman measurement showed that the content of sp of the Nano-DLC thin films decreases with the laser intensity. The field emission properties of the Nano-DLC thin films on Cu substrates were studied by the conventional diode method, which showed that the turn-on field increases and the current density decreases with sp content in the films. A lower turn-on field of 6 V/um and a higher current density of 1 uA/cm were obtained for Nano-DLC thin films on Cu substrate.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know