Photocurrent mapping of near-field optical antenna resonances
Nature Nanotechnology, ISSN: 1748-3395, Vol: 6, Issue: 9, Page: 588-593
2011
- 70Citations
- 137Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations70
- Citation Indexes70
- 70
- CrossRef64
- Captures137
- Readers137
- 137
Article Description
An increasing number of photonics applications make use of nanoscale optical antennas that exhibit a strong, resonant interaction with photons of a specific frequency. The resonant properties of such antennas are conventionally characterized by far-field light-scattering techniques. However, many applications require quantitative knowledge of the near-field behaviour, and existing local field measurement techniques provide only relative, rather than absolute, data. Here, we demonstrate a photodetector platform that uses a silicon-on-insulator substrate to spectrally and spatially map the absolute values of enhanced fields near any type of optical antenna by transducing local electric fields into photocurrent. We are able to quantify the resonant optical and materials properties of nanoscale (∼50nm) and wavelength-scale (∼1μm) metallic antennas as well as high-refractive-index semiconductor antennas. The data agree well with light-scattering measurements, full-field simulations and intuitive resonator models. © 2011 Macmillan Publishers Limited. All rights reserved.
Bibliographic Details
Springer Science and Business Media LLC
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know