PlumX Metrics
Embed PlumX Metrics

Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals

Applied Physics Letters, ISSN: 0003-6951, Vol: 92, Issue: 1
2008
  • 6
    Citations
  • 0
    Usage
  • 12
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    6
    • Citation Indexes
      6
  • Captures
    12

Article Description

Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. © 2008 American Institute of Physics.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know