Light-induced instability in current conduction of aluminum nitride thin films embedded with Al nanocrystals
Applied Physics Letters, ISSN: 0003-6951, Vol: 92, Issue: 1
2008
- 6Citations
- 12Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Al nanocrystals (nc-Al) embedded in AlN thin films have been synthesized by rf magnetron sputtering. The influence of ultraviolet (UV) illumination on electrical characteristics of the nc- AlAlN thin film system has been investigated. It is shown that the UV illumination could lead to a random change in the conductance of the thin film system. The change in the conductance is attributed to the charge trapping and detrapping in the nc-Al due to the UV illumination. © 2008 American Institute of Physics.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=38049010867&origin=inward; http://dx.doi.org/10.1063/1.2828691; https://pubs.aip.org/apl/article/92/1/013102/913516/Light-induced-instability-in-current-conduction-of; http://scitation.aip.org/content/aip/journal/apl/92/1/10.1063/1.2828691; http://scitation.aip.org/limit_exceeded.html
AIP Publishing
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