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Calculating Kelvin force microscopy signals from static force fields

Applied Physics Letters, ISSN: 0003-6951, Vol: 96, Issue: 10
2010
  • 26
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Metrics Details

  • Citations
    26
    • Citation Indexes
      26
  • Captures
    40

Article Description

We present an analytical formula to achieve numerical simulations of Kelvin force microscopy (KFM) signals from static force fields, which can be employed to describe amplitude-modulation or frequency-modulation KFM, as well as simultaneous topography and KFM modes for which the tip probe exhibits a nonzero oscillation during KFM imaging. This model is shown to account for side-capacitance and nonlinear effects taking place in KFM experiments, and can therefore be used conveniently to extract quantitative information from KFM experiments at the nanoscale. © 2010 American Institute of Physics.

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