Gaussian rough surfaces and Kirchhoff approximation
IEEE Transactions on Antennas and Propagation, ISSN: 0018-926X, Vol: 47, Issue: 2, Page: 392-398
1999
- 24Citations
- 12Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Electromagnetic scattering is often solved by applying Kirchhoff approximation to the Stratton-Chu scattering integral. In the case of rough surfaces, it is usually assumed that this is possible if the incident electromagnetic wavelength is small compared to the mean radius of curvature of the surface. Accordingly, evaluation of the latter is an important issue. This paper generalizes the groundwork of Papa and Lennon [1] by computing the mean radius of curvature for Gaussian rough surfaces with no restriction on its correlation function. This is an interesting extension relevant to a variety of natural surfaces. Relations between the surface parameters and the mean radius of curvature are determined and particular attention is paid to the relevant small slope regime.
Bibliographic Details
Institute of Electrical and Electronics Engineers (IEEE)
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know