Improved Artificial Electric Field Algorithm Using Nelder-Mead Simplex Method for Optimization Problems
4th International Symposium on Multidisciplinary Studies and Innovative Technologies, ISMSIT 2020 - Proceedings, Page: 1-5
2020
- 21Citations
- 6Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Conference Paper Description
Artificial electric field (AEF) algorithm was developed to be an alternative method for tackling with real-world engineering problems as a physics inspired meta-heuristic algorithm. Due to its stochastic nature, AEF suffers from poor exploitation, which needs to be improved. Therefore, this study attempts to obtain an effective structure by using AEF together with Nelder-Mead (NM) simplex search method. The proposed method has been named as artificial electric field with Nelder-Mead algorithm (AEF-NM). The proposed algorithm performs global search via AEF whereas NM is used to achieve better local search ability. In this way, a better performing algorithm has been achieved. Four well-known benchmark functions (Rosenbrock, Ackley, Sphere, Schwefel) were adopted to test the proposed algorithm. Comparative statistical analyses were carried out using the state-of-the-art algorithms such as sinecosine, atom search optimization, salp swarm and original AEF algorithms to observe the capability of the proposed AEF-NM. The proposed algorithm was shown to be have better performance than other compared algorithms.
Bibliographic Details
Institute of Electrical and Electronics Engineers (IEEE)
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