Environmental Effects on Developing Wheat as Sensed by Near-Infrared Reflectance of Mature Grains

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Delwiche, Stephen R.; Graybosch, Robert A.; Nelson, Lenis Alton; Hruschka, William R.
Plant Sciences
article description
For 30 years, near-infrared (NIR) spectroscopy has routinely been applied to the cereal grains for the purpose of rapidly measuring concentrations of constituents such as protein and moisture. The research described herein examined the ability of NIR reflectance spectroscopy on harvested wheat to determine weather-related, quality-determining properties that occurred during plant development. Twenty commercial cultivars or advanced breeding lines of hard red winter and hard white wheat (Triticum aestivum L.) were grown in 10 geographical locations under prevailing natural conditions of the U.S. Great Plains. Diffuse reflectance spectra (1,100-2,498 nm) of ground wheat from these samples were modeled by partial least squares one (PLS 1 ) and multiple linear regression algorithms for the following properties: SDS sedimentation volume, amount of time during grain fill in which the temperature or relative humidity exceeded or was less than a threshold level (i.e., >30, >32. >35. <24°C; >80%,