Second-harmonic and sum-frequency imaging of organic nanocrystals with photon scanning tunneling microscope

Citation data:

Applied Physics Letters, ISSN: 0003-6951, Vol: 77, Issue: 19, Page: 2946-2948

Publication Year:
2000
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Citations 35
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Repository URL:
http://scholarsmine.mst.edu/chem_facwork/448
DOI:
10.1063/1.1322629
Author(s):
Shen, Yuzhen; Swiatkiewicz, Jacek; Winiarz, Jeffrey G.; Markowicz, Przemyslaw P.; Prasad, Paras N.
Publisher(s):
AIP Publishing; American Institute of Physics (AIP)
Tags:
Physics and Astronomy; Chemistry
article description
Second-harmonic generation and sum-frequency generation with photon scanning tunneling microscopy and shear-force detection are used to map the nonlinear optical response and the surface topograph of N-(4-nitrophenyl)-(L)-prolinol crystals with a subdiffraction-limited resolution. The domain-size dependence of the spatial feature is obtained, which shows the local orientational distribution of the optical near field radiated by nonlinear nanocrystals and reveals the difference between nanoscopic and macroscopic second-order optical nonlinearities of molecular crystals. © 2000 American Institute of Physics.