Developing a Universal Exchange Format for Near-field Scan Data

Citation data:

IEEE International Symposium on Electromagnetic Compatibility, 2009. EMC 2009

Publication Year:
2009

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Repository URL:
http://scholarsmine.mst.edu/ele_comeng_facwork/17
Author(s):
Shepherd, John; Nakamura, Atsushi; Lafon, Frederic; Sicard, Etienne; Ramdani, Mohamed; Pommerenke, David; Muchaidze, Giorgi; Serpaud, Sebastien
Publisher(s):
Institute of Electrical and Electronics Engineers (IEEE)
Tags:
Electrical and Computer Engineering
article description
By John Shepherd, Atsushi Nakamura, Frederic Lafon, et al., Published on 08/01/09