Damage Analysis Modified TRAC Computer Program (DAMTRAC)
1975
- 491Usage
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Usage491
- Downloads470
- Abstract Views21
Article Description
A computer program tailored for EMP damage analysis of solid-state circuitry has been developed by modifying the existing TRAC network analysis program. Modification of the TRAC diode and transistor models to include breakdown parameters and the addition of a semiconductor device parameter library have greatly simplified the analyst's task. An added feature is a subroutine that automatically calculates the amplitude and duration of transient power dissipated in electronic circuit components.
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