Evidence for shallow acceptors in GaN
Journal of Applied Physics, ISSN: 0021-8979, Vol: 89, Issue: 11 I, Page: 6272-6274
2001
- 5Citations
- 187Usage
- 5Captures
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Metrics Details
- Citations5
- Citation Indexes5
- CrossRef4
- Usage187
- Downloads185
- Abstract Views2
- Captures5
- Readers5
Article Description
Two low-temperature photoluminescence lines in GaN, in the region of energies commonly interpreted as longitudinal optical-phonon replicas of free excitons, donor-bound excitons, or acceptor-bound excitons, are reinterpreted as acceptor-bound excitons (AX's) collapsing to n = 2 and n = 3 excited states, respectively, of the acceptors involved. Application of this model to two sets of AX-related lines in hydride-vapor-phase-grown GaN gives acceptor energies of 85±1, and 115±1 meV, respectively. The existence of such shallow acceptor states, if confirmed, is of great technological importance. © 2001 American Institute of Physics.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0035356156&origin=inward; http://dx.doi.org/10.1063/1.1364646; https://pubs.aip.org/jap/article/89/11/6272/488269/Evidence-for-shallow-acceptors-in-GaN; https://corescholar.libraries.wright.edu/physics/148; https://corescholar.libraries.wright.edu/cgi/viewcontent.cgi?article=1193&context=physics
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