Accurate measurement of capture cross sections in deep level transient spectroscopy: Application to EL2 in GaAs
Journal of Electronic Materials, ISSN: 0361-5235, Vol: 24, Issue: 10, Page: 1461-1464
1995
- 8Citations
- 13Usage
- 4Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations8
- Citation Indexes8
- CrossRef5
- Usage13
- Abstract Views13
- Captures4
- Readers4
Article Description
A rigorous formulation of capacitance changes during trap filling processes is presented and used to accurately determine the electron capture cross section of EL2 in GaAs at a particular temperature, 377K, in this case. The value, σ (377K) = 2.7 × 10 cm, is compared with that predicted from the emission dependence. © 1995 The Metallurgical of Society of AIME.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0029389626&origin=inward; http://dx.doi.org/10.1007/bf02655464; http://link.springer.com/10.1007/BF02655464; http://link.springer.com/content/pdf/10.1007/BF02655464; http://link.springer.com/content/pdf/10.1007/BF02655464.pdf; http://link.springer.com/article/10.1007/BF02655464/fulltext.html; https://corescholar.libraries.wright.edu/physics/402; https://corescholar.libraries.wright.edu/cgi/viewcontent.cgi?article=1447&context=physics; https://dx.doi.org/10.1007/bf02655464; https://link.springer.com/article/10.1007/BF02655464; http://www.springerlink.com/index/10.1007/BF02655464; http://www.springerlink.com/index/pdf/10.1007/BF02655464
Springer Science and Business Media LLC
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