Optimal segmentation of signals and its application to image denoising and boundary feature extraction
Proceedings - International Conference on Image Processing, ICIP, ISSN: 1522-4880, Vol: 4, Page: 2693-2696
2004
- 12Citations
- 3Usage
- 11Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations12
- Citation Indexes12
- 12
- CrossRef6
- Usage3
- Abstract Views3
- Captures11
- Readers11
- 11
Conference Paper Description
An optimal procedure for segmenting one-dimensional signals whose parameters are unknown and change at unknown times is presented. The method is maximum likelihood segmentation, which is computed using dynamic programming. In this procedure, the number of segments of the signal need not be known a priori but is automatically chosen by the Minimum Description Length rule. The signal is modeled as unknown DC levels and unknown jump instants with an example chosen to illustrate the procedure. This procedure is applied to image denoising and boundary feature extraction. Because the proposed method uses the global information of the whole image, the results are more robust and reasonable than those obtained through classical procedures which only consider local information. The possible directions for improvement are discussed in the conclusion. © 2004 IEEE.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=20444462742&origin=inward; http://dx.doi.org/10.1109/icip.2004.1421659; http://ieeexplore.ieee.org/document/1421659/; http://xplorestaging.ieee.org/ielx5/9716/30679/01421659.pdf?arnumber=1421659; https://digitalcommons.uri.edu/ele_facpubs/1337; https://digitalcommons.uri.edu/cgi/viewcontent.cgi?article=2336&context=ele_facpubs
Institute of Electrical and Electronics Engineers (IEEE)
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