Mapping Solid Surfaces with a Raman Microprobe
Vol: 1986, Issue: 2
1986
- 41Usage
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Usage41
- Downloads34
- Abstract Views7
Article Description
By combining an optical microscope with a standard Raman scattering apparatus, information on the structure, composition, homogeneity, and stress state of solids can be obtained with one micron resolution. After a discussion of the advantages and implementation of the technique, we examine specific applications mostly taken from our own work dealing with laser-solid interactions. In particular, we examine the structural modifications produced during laser annealing of semiconductors and laser induced damage of thin films.
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