Single-Event Latch-Up (SEL) Automatic Detection and Recovery for the RT6804-1 Battery Stack Monitor
2020
- 343Usage
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Usage343
- Abstract Views212
- Downloads131
Artifact Description
From previous SEE testing on the RT6804-11, a soft latch-up condition was identified with this device. When exposed to heavy ions, the RT6804-1’s supply current can increase from the typical 12mA to 30mA or higher. This condition can be corrected by pulling all of the cell pins to GND. ADI wanted to provide an application circuit that automatically detects and corrects this SEL condition using minimal external components. This paper describes the mitigation circuit operation and SEE test results.
Bibliographic Details
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