Imaging ultrathin Al 2 O 3 films with scanning tunneling microscopy
Chemical Physics Letters, ISSN: 0009-2614, Vol: 330, Issue: 3, Page: 226-230
2000
- 20Citations
- 1Usage
- 12Captures
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Metrics Details
- Citations20
- Citation Indexes20
- 20
- CrossRef18
- Usage1
- Abstract Views1
- Captures12
- Readers12
- 12
Article Description
Reproducible scanning tunneling microscopic (STM) images were obtained from ultrathin Al 2 O 3 films epitaxially grown on Re(0001). Initially, the oxide films grow two-dimensionally in a layer-by-layer fashion with well-ordered surface morphologies. As the oxide film thickens to ca. 9 monolayer equivalents (MLE), the surface roughens and becomes more disordered yet still exhibits significant long-range, hexagonal periodicity as indicated by low energy electron diffraction (LEED). Because of limited conductivity, films thicker than ca. 9 MLE could not be imaged.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S000926140001099X; http://dx.doi.org/10.1016/s0009-2614(00)01099-x; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0000666535&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S000926140001099X; https://dul.usage.elsevier.com/doi/; https://api.elsevier.com/content/article/PII:S000926140001099X?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S000926140001099X?httpAccept=text/plain; http://linkinghub.elsevier.com/retrieve/pii/S000926140001099X; http://api.elsevier.com/content/article/PII:S000926140001099X?httpAccept=text/xml; http://api.elsevier.com/content/article/PII:S000926140001099X?httpAccept=text/plain; http://scholarsmine.mst.edu/chem_facwork/704; http://scholarsmine.mst.edu/cgi/viewcontent.cgi?article=1703&context=chem_facwork; http://dx.doi.org/10.1016/s0009-2614%2800%2901099-x; https://dx.doi.org/10.1016/s0009-2614%2800%2901099-x
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