Analytical and numerical sensitivity analyses of fixtures de-embedding
IEEE International Symposium on Electromagnetic Compatibility, ISSN: 2158-1118, Vol: 2016-September, Page: 440-444
2016
- 30Citations
- 23Usage
- 5Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Metrics Details
- Citations30
- Citation Indexes30
- 30
- CrossRef4
- Usage23
- Abstract Views23
- Captures5
- Readers5
Conference Paper Description
De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84990879015&origin=inward; http://dx.doi.org/10.1109/isemc.2016.7571688; http://ieeexplore.ieee.org/document/7571688/; http://xplorestaging.ieee.org/ielx7/7565235/7571555/07571688.pdf?arnumber=7571688; https://scholarsmine.mst.edu/ele_comeng_facwork/2036; https://scholarsmine.mst.edu/cgi/viewcontent.cgi?article=3036&context=ele_comeng_facwork
Institute of Electrical and Electronics Engineers (IEEE)
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