A Systematic Method for Determining Soft-Failure Robustness of a Subsystem
Proceedings of the 35th Electrical Overstress/Electrostatic Discharge Symposium (2013, Las Vegas, NV)
2013
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Conference Paper Description
A systematic method for evaluating soft fail robustness of a DUT subsystem is presented and demonstrated on a camera MIPI interface. Two different mobile phone platforms are studied under TLP injection while various methods for extracting failure thresholds and localization are applied. The root cause for the soft-failure threshold discrepancy is left for future work.
Bibliographic Details
Institute of Electrical and Electronics Engineers (IEEE)
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