Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables
IEE Conference Publication, ISSN: 0537-9989, Issue: 473, Page: 212-217
2000
- 36Citations
- 12Usage
- 16Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
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Metrics Details
- Citations36
- Citation Indexes36
- 36
- CrossRef12
- Usage12
- Abstract Views12
- Captures16
- Readers16
- 16
Conference Paper Description
The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=0034543572&origin=inward; http://dx.doi.org/10.1049/cp:20000507; https://digital-library.theiet.org/content/conferences/10.1049/cp_20000507; http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=888116; https://scholarsmine.mst.edu/ele_comeng_facwork/2607; https://scholarsmine.mst.edu/cgi/viewcontent.cgi?article=3608&context=ele_comeng_facwork; http://dx.doi.org/10.1049/cp%3A20000507; https://dx.doi.org/10.1049/cp%3A20000507; https://chooser.crossref.org/?doi=10.1049%2Fcp%3A20000507
Institution of Engineering and Technology (IET)
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