Post-configuration repair strategy for asynchronous nanowire crossbar system
Midwest Symposium on Circuits and Systems, ISSN: 1548-3746, Page: 174-177
2012
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
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Conference Paper Description
The recently proposed asynchronous nanowire crossbar architecture is envisioned to enhance the manufacturability and robustness of nanowire crossbar-based configurable digital circuits by removing various timing-related failure modes. Even though the proposed clock-free nanowire crossbar architecture has numerous technical merits over its clocked counterparts, it is still subject to high defect rates inherently induced by the nondeterministic nanoscale assembly of nanowire crossbars. To address this issue, a novel post-configuration repair strategy specific to the asynchronous nanowire crossbar architecture has been proposed. The proposed repair strategy is to selectively test highly defect-prone ON-state programmed crosspoints and reconfigure the given logic function to circumvent the ON-crosspoints tested as faulty by utilizing redundant rows/columns. © 2012 IEEE.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84867290854&origin=inward; http://dx.doi.org/10.1109/mwscas.2012.6291985; http://ieeexplore.ieee.org/document/6291985/; http://xplorestaging.ieee.org/ielx5/6276898/6291930/06291985.pdf?arnumber=6291985; http://scholarsmine.mst.edu/ele_comeng_facwork/3189; https://scholarsmine.mst.edu/ele_comeng_facwork/3189; https://doi.org/10.1109/MWSCAS.2012.6291985
Institute of Electrical and Electronics Engineers (IEEE)
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