FINITE ELEMENT ANALYSIS AND EXPERIMENTAL VERIFICATION OF SOI WAVEGUIDE LOSSES
2007
- 2,458Usage
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Usage2,458
- Downloads2,404
- 2,404
- Abstract Views54
Thesis / Dissertation Description
Bending loss in silicon-on-insulator rib waveguides was calculated using conformal mapping of the curved waveguide to an equivalent straight waveguide. Finite-element analysis with perfectly matched layer boundaries was used to solve the vector wave equation. Transmission loss was experimentally measured as a function of bend radius for several SOI waveguides. Good agreement was found between simulated and measured losses, and this technique was confirmed as a good predictor for loss and for minimum bend radius for efficient design.
Bibliographic Details
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