Dynamic characterization of a soft elastomeric capacitor for structural health monitoring applications

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Proceedings of SPIE - The International Society for Optical Engineering, ISSN: 1996-756X, Vol: 9061, Issue: 906115, Page: 906115-906115

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Jerome P. Lynch; Kon-Well Wang; Hoon Sohn; Hussam Saleem; Simon Laflamme; Filippo Ubertini
SPIE-Intl Soc Optical Eng
Mathematics; Computer Science; Engineering; Materials Science; Physics and Astronomy; structural health monitoring; strain gauge; Dynamic Characterization; Bio-inspired sensing; Soft elastomeric capacitor; smart sensors; thin-film sensors
conference paper description
A novel thin film sensor consisting of a soft elastomeric capacitor (SEC) for meso-scale monitoring has been developed by the authors. Each SEC transduces surface strain into a measurable change in capacitance. In previous work, the authors have shown that the performance of the SEC compares well with conventional resistive strain gauges, providing a resolution of 25 με using an inexpensive off-the-shelf data acquisition system for capacitance measurements. Here, we further the understanding of the thin film sensor by characterizing its dynamic behavior. The SEC is subjected to dynamic loads in bending mode. The study of Fourier and wavelet transforms indicates that the sensor can be used to identify dynamic inputs. Overall results demonstrate the promising capabilities of the thin film sensor at dynamic monitoring of civil structures. © 2014 SPIE.