High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths

Citation data:

Optics Letters, ISSN: 1539-4794, Vol: 30, Issue: 20, Page: 2727-2729

Publication Year:
2005
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Repository URL:
https://pdxscholar.library.pdx.edu/phy_fac/78
DOI:
10.1364/ol.30.002727; 10.1364/ol.30.002727.
Author(s):
Leung, P.T.; Chiang, Hai-Pang; Lin, Jing-Lun; Chang, Railing; Su, Sheng-Yu
Publisher(s):
The Optical Society
Tags:
Physics and Astronomy; Plasmons (Physics); Surface plasmon resonance; Nanostructures -- Optical properties; Physics
article description
It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmonresonance excitation in which the phase difference between p-and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9×10 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values. © 2005 Optical Society of America.