High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths
- Citation data:
Optics Letters, ISSN: 1539-4794, Vol: 30, Issue: 20, Page: 2727-2729
- Publication Year:
- Repository URL:
- 10.1364/ol.30.002727; 10.1364/ol.30.002727.
- Physics and Astronomy; Plasmons (Physics); Surface plasmon resonance; Nanostructures -- Optical properties; Physics
It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmonresonance excitation in which the phase difference between p-and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9×10 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values. © 2005 Optical Society of America.