Microstructures and enhancement of critical current density in YBa CuO thin films grown by pulsed laser deposition on various single crystal substrates modified by Ag nano-dots

Citation data:

IEEE Transactions on Applied Superconductivity, ISSN: 1051-8223, Vol: 15, Issue: 2 PART III, Page: 3046-3049

Publication Year:
2005
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Repository URL:
https://works.bepress.com/xlwang/43; https://ro.uow.edu.au/engpapers/59; https://works.bepress.com/sxdou/39; https://works.bepress.com/hkliu/56
DOI:
10.1109/tasc.2005.848731
Author(s):
Li, Aihua; Ionescu, M.; Liu, Hua-Kun; Silver, Tania M; Wang, Xiaolin; Dou, S. X.
Publisher(s):
Institute of Electrical and Electronics Engineers (IEEE)
Tags:
Materials Science; Physics and Astronomy; Engineering
conference paper description
YBaCuO (Y123) thin films were grown by pulsed laser deposition (PLD) on YSZ (100), SrTiO3 (100), and LaAlO3 (100) single crystal substrates. Prior to the film deposition, a discontinuous layer of Ag nano-dots was deposited on the substrates. The Y123 films grown on such surfaces modified with Ag nano-dots were characterized by Atomic Force Microscopy (AFM), X-ray diffraction (XRD), scanning electron microscopy (SEM), AC susceptibility and DC magnetization. The effects of the density of Ag nano-dots, which was controlled by the numbers of PLD shots, on the microstructures and resultant critical current density J have been studied systematically. Results showed that at fixed physical deposition conditions J increased monotonically with number of Ag shots, n, for films grown on both STO and LAO substrates. At 77 K, the J increased from 10 to 3.2 × 10 A/cm for LAO and from 8 × 10 to 3.5 × 106 A/cm for STO as n increased from 0 to 150. At 5 K, the enhancement of J was approximately four times at both low and high fields. However, for films grown on YSZ substrate, J increased from 2 × 10 to 2 × 10 A/cm as Ag shots increased from 0 to 30, and decreased to 9 × 10 for n ≥ 60. Detailed microstructure investigations indicated that the crystallinity and ab alignment gradually improved as the number of Ag-nano-dots increased. © 2005 IEEE.