Simultaneous measurement of normal and friction forces using a cantilever-based optical interfacial force microscope.

Citation data:

The Review of scientific instruments, ISSN: 1089-7623, Vol: 82, Issue: 5, Page: 053711

Publication Year:
Usage 328
Downloads 246
Abstract Views 62
Full Text Views 20
Captures 2
Exports-Saves 1
Readers 1
Citations 8
Citation Indexes 8
Repository URL:
Kim, Byung I.; Bonander, Jeremy R.; Rasmussen, Jared A.
AIP Publishing
Physics and Astronomy; COIFM; cantilever-based optical interfacial force microscope; force-distance curve; Physics
article description
We measured normal and friction forces simultaneously using a recently developed cantilever-based optical interfacial force microscope technique for studies of interfacial structures and mechanical properties of nanoscale materials. We derived how the forces can be incorporated into the detection signal using the classical Euler equation for beams. A lateral modulation with the amplitude of nanometers was applied to create the friction forces between tip and sample. We demonstrated its capability by measuring normal and friction forces of interfacial water at the molecular scale over all distance ranges.