Full-field subwavelength imaging using a scattering superlens.

Citation data:

Physical review letters, ISSN: 1079-7114, Vol: 113, Issue: 11, Page: 113901

Publication Year:
2014
Usage 3
Abstract Views 3
Captures 62
Readers 62
Citations 41
Citation Indexes 41
Repository URL:
http://scholarworks.unist.ac.kr/handle/201301/19971
PMID:
25259979
DOI:
10.1103/physrevlett.113.113901
Author(s):
Park, Chunghyun; Park, Jung-Hoon; Rodriguez, Christophe; Yu, HyeonSeung; Kim, Minkwan; Jin, Kyoungsuk; Han, Seungyong; Shin, Jonghwa; Ko, Seung Hwan; Nam, Ki Tae; Lee, Yong-Hee; Cho, Yong-Hoon; Park, YongKeun Show More Hide
Publisher(s):
American Physical Society (APS); AMER PHYSICAL SOC
Tags:
Physics and Astronomy
article description
Light-matter interaction gives optical microscopes tremendous versatility compared with other imaging methods such as electron microscopes, scanning probe microscopes, or x-ray scattering where there are various limitations on sample preparation and where the methods are inapplicable to bioimaging with live cells. However, this comes at the expense of a limited resolution due to the diffraction limit. Here, we demonstrate a novel method utilizing elastic scattering from disordered nanoparticles to achieve subdiffraction limited imaging. The measured far-field speckle fields can be used to reconstruct the subwavelength details of the target by time reversal, which allows full-field dynamic super-resolution imaging. The fabrication of the scattering superlens is extremely simple and the method has no restrictions on the wavelength of light that is used.