Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

Citation data:

MRS Bulletin, ISSN: 0883-7694, Vol: 43, Issue: 7, Page: 497-503

Publication Year:
2018
Citations 2
Citation Indexes 2
DOI:
10.1557/mrs.2018.148
Author(s):
Enrico Pomarico; Ye-Jin Kim; F. Javier García de Abajo; Oh-Hoon Kwon; Fabrizio Carbone; Renske M. van der Veen
Publisher(s):
Cambridge University Press (CUP)
Tags:
Materials Science; Physics and Astronomy; Chemistry
article description
In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.