Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

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MRS Bulletin, ISSN: 0883-7694, Vol: 43, Issue: 7, Page: 497-503

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Pomarico, Enrico; Kim, Ye‐Jin; de Abajo, F. Javier García; Kwon, Oh-Hoon; Carbone, Fabrizio; van der Veen, Renske M
Cambridge University Press (CUP); CAMBRIDGE UNIV PRESS
Materials Science; Physics and Astronomy; Chemistry
article description
In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.