Determination of the thickness and orientation of few-layer tungsten ditelluride using polarized Raman spectroscopy

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2D Materials, ISSN: 2053-1583, Vol: 3, Issue: 3

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Kim, Minjung; Han, Songhee; Kim, Jung Hwa; Lee, Jae-Ung; Lee, Zonghoon; Cheong, Hyeonsik
Chemistry; Materials Science; Physics and Astronomy; Engineering; tungsten ditelluride; WTe2; Raman spectroscopy; polarization; orientation; thickness
article description
Orthorhombic tungsten ditelluride (WTe), with a distorted 1T structure, exhibits a large magnetoresistance that depends on the orientation, and its electrical characteristics changes from semimetallic to insulating as the thickness decreases. Through polarized Raman spectroscopy in combination with transmission electron diffraction, we establish a reliable method to determine the thickness and crystallographic orientation of few-layer WTe. The Raman spectrum shows a pronounced dependence on the polarization of the excitation laser.Wefound that the separation between two Raman peaks at∼90 cmand at 80-86 cm, depending on thickness, is a reliable fingerprint for determination of the thickness. For determination of the crystallographic orientation, the polarization dependence of the A1 modes, measured with the 632.8 nmexcitation, turns out to be the most reliable.Wealso discovered that the polarization behaviors of some of the Raman peaks depend on the excitation wavelength as well as thickness, indicating a close interplay between the band structure and anisotropic Raman scattering cross section.