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Preparation and optical properties of amorphous and crystalline BLT thin films grown on SiO/Si(100) substrates by a CSD process

Physica Status Solidi (A) Applied Research, ISSN: 0031-8965, Vol: 201, Issue: 5, Page: 977-982
2004
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Conference Paper Description

Amorphous and crystalline BiLaTi O thin films deposited on SiO/Si(100) substrates have been prepared by a chemical solution deposition (CSD) process. X-ray diffraction shows that the crystal structure is a bismuth-layered perovskite structure with some preferred (117) orientation. The refractive indices and extinction coefficients of the amorphous and crystalline films were obtained by spectroscopic ellipsometry as a function of photo energy in the range from 1.8 to 4.0 eV. The dispersion of refractive indices was fitted by the Wemple-Didomenico single electronic oscillator dispersion mode. An interesting exponential absorption was found in the amorphous and crystalline BLT films, which may be ascribed to the substitution of lanthanum for bismuth. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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