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Coherence of high-angle scattered phonon loss electrons and their relevance to TEM and STEM ADF Stobbs Factors

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany, Page: 121-122
2008
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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

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