Highly Charged Ions in Rare Earth Permanent Magnet Penning Traps
Springer Series on Atomic, Optical, and Plasma Physics, ISSN: 2197-6791, Vol: 76, Page: 39-56
2013
- 1Citations
- 3Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Book Chapter Description
A newly constructed apparatus at the United States National Institute of Standards and Technology (NIST) is designed for the isolation, manipulation, and study of highly charged ions. Highly charged ions are produced in the NIST electron-beam ion trap (EBIT), extracted through a beamline that selects a single mass/charge species, then captured in a compact Penning trap. The magnetic field of the trap is generated by cylindrical NdFeB permanent magnets integrated into its electrodes. In a room-temperature prototype trap with a single NdFeB magnet, species including Ne and N were confined with storage times of order 1 second, showing the potential of this setup for manipulation and spectroscopy of highly charged ions in a controlled environment. Ion capture has since been demonstrated with similar storage times in a more-elaborate Penning trap that integrates two coaxial NdFeB magnets for improved B-field homogeneity. Ongoing experiments utilize a second-generation apparatus that incorporates this two-magnet Penning trap along with a fast time-of-flight MCP detector capable of resolving the charge-state evolution of trapped ions. Holes in the two-magnet Penning trap ring electrode allow for optical and atomic beam access. Possible applications include spectroscopic studies of one-electron ions in Rydberg states, as well as highly charged ions of interest in atomic physics, metrology, astrophysics, and plasma diagnostics.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84890337985&origin=inward; http://dx.doi.org/10.1007/978-3-642-38167-6_3; https://link.springer.com/10.1007/978-3-642-38167-6_3; https://dx.doi.org/10.1007/978-3-642-38167-6_3; https://link.springer.com/chapter/10.1007/978-3-642-38167-6_3
Springer Science and Business Media LLC
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know