Universal Discrete Finite Rate of Innovation Scheme for Sparse Signal Reconstruction
Circuits, Systems, and Signal Processing, ISSN: 1531-5878, Vol: 42, Issue: 4, Page: 2346-2365
2023
- 3Citations
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Metrics Details
- Citations3
- Citation Indexes3
- CrossRef2
Article Description
Finite rate of innovation (FRI) schemes have been proposed to reconstruct a class of discrete-time signals having small number of nonzero coefficients (sparse signals) from a limited number of observations. However, these reconstruction schemes achieve optimal performance up to a certain signal-to-noise ratio (SNR) and breakdown for smaller SNR values. Moreover, these are not universal as they are aware of the number of nonzero coefficients (a.k.a. L0 norm) for reconstruction of the signal. In this paper, we propose a novel FRI reconstruction scheme based on error decrease detector criterion to extend the current scheme to a universal one which enables reconstructing signals with an unknown number of nonzero coefficients. With noiseless conditions, we show that the proposed FRI scheme achieves perfect reconstruction of the original signal. And also, computer simulations for the noisy case are presented where the proposed scheme shows improvements over the traditional FRI scheme in the breakdown SNR. Further, an application of the proposed universal FRI scheme on reconstruction of magnetic resonance images and QRS complexes is demonstrated.
Bibliographic Details
Springer Science and Business Media LLC
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