PlumX Metrics
Embed PlumX Metrics

Spectroscopic analysis of packaging concepts for high-power diode laser bars

Applied Physics A: Materials Science and Processing, ISSN: 0947-8396, Vol: 107, Issue: 2, Page: 371-377
2012
  • 12
    Citations
  • 0
    Usage
  • 1
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    12
    • Citation Indexes
      12
  • Captures
    1

Article Description

Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being singleside cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy. © 2012 Springer-Verlag.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know