A Standardized Interpolation of Temperature Using Rhodium–Iron Resistance Thermometers Over the Interval 4.2 K to 24.5 K
International Journal of Thermophysics, ISSN: 0195-928X, Vol: 36, Issue: 8, Page: 2036-2059
2015
- 3Citations
- 1Captures
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Article Description
The worldwide history and present state of development of rhodium–iron resistance thermometers (RIRTs) is briefly reviewed. A standardized interpolation method using RIRTs with the nominal composition of 0.5 % Fe (by mole) is presented, with examples using data taken from 60 RIRTs made from a variety of wire batches and sources worldwide over the last 40 years. The parameterization exploits the favorable characteristics of the Cragoe reduced resistance Z(τ) and a suitably reduced temperature τ. A reference function Z(τ) which approximates the average characteristics of selected wire is derived for use over the interval 0.65 K to 24.5561 K on the ITS-90. The deviations of real RIRT data from this reference function are examined, and simple four-parameter Fourier-series solutions for the resulting deviation curves are presented. Despite the fact that the wire samples may be of different origins or state-of-anneal, it was found that the interpolations are successful for most of the samples studied over the 4.2 K to 24.5561 K interval, at the level of ≈1 mK standard uncertainty or less. This method would allow for calibrations of most RIRTs over this interval using only six calibration points, permitting an efficiency not achievable using the common least-squares curve-fitting calibration methods. The potential of this formalism for a standardized interpolation scheme using RIRTs is discussed.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84940723303&origin=inward; http://dx.doi.org/10.1007/s10765-015-1877-4; http://link.springer.com/10.1007/s10765-015-1877-4; http://link.springer.com/content/pdf/10.1007/s10765-015-1877-4; http://link.springer.com/content/pdf/10.1007/s10765-015-1877-4.pdf; http://link.springer.com/article/10.1007/s10765-015-1877-4/fulltext.html; https://dx.doi.org/10.1007/s10765-015-1877-4; https://link.springer.com/article/10.1007/s10765-015-1877-4
Springer Science and Business Media LLC
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