Strain accommodation of <110>-normal direction-oriented grains in micro-shear bands of high-purity tantalum
Journal of Materials Science, ISSN: 1573-4803, Vol: 53, Issue: 17, Page: 12543-12552
2018
- 14Citations
- 9Captures
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Article Description
The <110>ND(<110>//normal direction)(<110>ND) grains in micro-shear bands in high-purity tantalum were investigated using electron backscatter diffraction and X-ray line profile analysis. The generation of the <110>ND grains and their subdivision and rotation behaviors upon the subsequent deformation were characterized by multi-scale analysis methods based on information about the slip systems, misorientation angle/axes and stored energy. The obtained results show that in the transverse plane, <110>ND grains are oriented at angles of 15°–25° to the adjacent deformed matrices in the 60% rolled specimen, and at angles of 25°–35° in the 87% rolled specimen. The <110>ND grain provided strain accommodation during the shear deformation. Moreover, the energy of the <110>ND grains in the 87% rolled specimen is approximately three times larger than that in the 60% rolled specimen, indicating that the role of strain accommodation is enhanced with the increase in the micro-shear stress concentration in a local region in tantalum.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85047659031&origin=inward; http://dx.doi.org/10.1007/s10853-018-2506-y; http://link.springer.com/10.1007/s10853-018-2506-y; http://link.springer.com/content/pdf/10.1007/s10853-018-2506-y.pdf; http://link.springer.com/article/10.1007/s10853-018-2506-y/fulltext.html; https://dx.doi.org/10.1007/s10853-018-2506-y; https://link.springer.com/article/10.1007/s10853-018-2506-y
Springer Science and Business Media LLC
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