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Electroplated indium bumps as thermal and electrical connections of NTD-ge sensors for the fabrication of microcalorimeter arrays

Journal of Low Temperature Physics, ISSN: 1573-7357, Vol: 167, Issue: 3-4, Page: 535-540
2012
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Article Description

We are developing a method to build arrays of Ge-based microcalorimeters for soft X-rays detection using micro-photolithographic techniques. A key element of the process is the electrical and thermal connection between the germanium sensors and the interconnection electrical tracks, that lay on a substrate acting as mechanical support and thermal sink. The geometry of the sensors, that have a square base truncated pyramid shape, makes feasible a connection through indium soldering. We describe a technique, based on microlithography and electroplating, adopted to grow indium bumps of a few tens of square microns of area and several microns high on top of the contact pads patterned on the substrate. The sensor array is placed over the bumps and a subsequent baking melts the indium, soldering the sensors to the pads. © Springer Science+Business Media, LLC 2012.

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