Polarized XAFS Analyses for MgB Thin Films
Journal of Superconductivity and Novel Magnetism, ISSN: 1557-1947, Vol: 30, Issue: 6, Page: 1665-1667
2017
- 6Citations
- 2Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
The local structure of 10, 20, and 30-nm MgB thin films prepared by molecular beam epitaxy (MBE) is analyzed by polarized X-ray absorption fine structure (XAFS) of Mg K-edge, which is a powerful tool for structural analysis with element selectivity using a synchrotron radiation source. The structural parameters are obtained from extended X-ray absorption fine structure (EXAFS) analysis for 20-nm MgB film. X-ray near edge structure (XANES) analysis estimated the proportion of MgO inserted between the MgB film and ZnO substrate. The linear relation is found between the MgO proportion and T.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85011875117&origin=inward; http://dx.doi.org/10.1007/s10948-017-3991-y; http://link.springer.com/10.1007/s10948-017-3991-y; http://link.springer.com/content/pdf/10.1007/s10948-017-3991-y.pdf; http://link.springer.com/article/10.1007/s10948-017-3991-y/fulltext.html; https://dx.doi.org/10.1007/s10948-017-3991-y; https://link.springer.com/article/10.1007/s10948-017-3991-y
Springer Nature
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know