Metrology of Single Photons for Quantum Information Technologies
Measurement Techniques, ISSN: 1573-8906, Vol: 60, Issue: 3, Page: 235-241
2017
- 5Citations
- 2Captures
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
A new approach is proposed for the metrology of optical measurements – the quantum metrology of photons. The specific nature of measurements of quantum polarization states of single and polarization-entangled photons is examined. The fundamental objectives of the modern metrology of photons are formulated.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85026897712&origin=inward; http://dx.doi.org/10.1007/s11018-017-1179-2; http://link.springer.com/10.1007/s11018-017-1179-2; http://link.springer.com/content/pdf/10.1007/s11018-017-1179-2.pdf; http://link.springer.com/article/10.1007/s11018-017-1179-2/fulltext.html; https://dx.doi.org/10.1007/s11018-017-1179-2; https://link.springer.com/article/10.1007/s11018-017-1179-2
Springer Nature
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