Effect of HfO on the dielectric, optoelectronic and energy harvesting properties of PVDF
Optical and Quantum Electronics, ISSN: 1572-817X, Vol: 51, Issue: 10
2019
- 16Citations
- 20Captures
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Article Description
In this article, energy recovery based on PVDF doped with HfO is proposed. The free energy of CH=CF is determined in different base with the B3LPY functional. The basis set LanL2DZ was chosen because it takes into account the atom of hafnium of atomic number Z = 72 which exceeds the extension of some basis sets. In addition, LanL2DZ gives an accurate result and a reasonable computing time. The geometries of the molecules were optimized with B3LPY/LanL2DZ. The motivation of this study is the improvement of the optoelectronic, dielectric and piezoelectric properties of PVDF by introducing HfO into its matrix. We determined the parameters of (-CH2-CF2-)3·xHfO2 and identified the effect of HfO on the PVDF. It appears that the permittivity of the modified PVDF increases. When the PVDF is doped once or twice, a fluorine atom is captured by the hafnium. The migration of fluorine towards HfO considerably favors the electric polarization of the molecule. It then results in an important dipole moment with a polar phase undoubtedly favored. Our results show that the molecule (-CH2-CF2-)3·HfO2 is a good dielectric material (Eg=5.90eV) and can be a good piezoelectric material. The electronic affinity of the modified PVDF is significantly higher than that of virgin PVDF. This demonstrates that HfO-doped PVDF is more stable than virgin PVDF. The piezoelectric properties are significantly improved. The piezoelectric coefficient varies between 13.111 and 25.635 pC N for the modified PVDF compared to 11.979pC N-1 for the virgin PVDF. In conclusion, HfO improves the dielectric, optoelectronic and piezoelectric properties of PVDF.
Bibliographic Details
http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85073192441&origin=inward; http://dx.doi.org/10.1007/s11082-019-2042-2; http://link.springer.com/10.1007/s11082-019-2042-2; http://link.springer.com/content/pdf/10.1007/s11082-019-2042-2.pdf; http://link.springer.com/article/10.1007/s11082-019-2042-2/fulltext.html; https://dx.doi.org/10.1007/s11082-019-2042-2; https://link.springer.com/article/10.1007/s11082-019-2042-2
Springer Science and Business Media LLC
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