PlumX Metrics
Embed PlumX Metrics

Surface and interface stress effects on the growth of thin films

Journal of Electronic Materials, ISSN: 0361-5235, Vol: 26, Issue: 9, Page: 966-968
1997
  • 16
    Citations
  • 0
    Usage
  • 29
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    16
    • Citation Indexes
      16
  • Captures
    29

Article Description

Surface and interface stresses represent the work per unit area to stretch the surface of a solid. These types of stresses are discussed, emphasizing their relevance to thin film growth. In particular, the influence of these parameters on the critical thickness for epitaxy and for intrinsic thin film stress generation are considered.

Provide Feedback

Have ideas for a new metric? Would you like to see something else here?Let us know