In situ XPS characterization of the species derived from supported Os carbonyls
Spectrochimica Acta Part A: Molecular Spectroscopy, ISSN: 0584-8539, Vol: 43, Issue: 12, Page: 1497-1501
1987
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- 2Captures
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Article Description
The surface reactivity of SiO2-supported Os carbonyl clusters has been followed by in situ treatments in the X-ray photoelectron spectrometer chamber. The mean Os oxidation state in all reported initial systems has been obtained. The effects of exposing to different gases (H 2, O 2, CO, N 2, Ar) and at different temperatures (373-623 K) the samples have been rationalized by comparison with binding energy (b.c.) data for pure Os species [R. Zanoni et al., J. molec. Struct. 131, 363 (1985)] or untreated samples.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0584853987800375; http://dx.doi.org/10.1016/s0584-8539(87)80037-5; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84913818142&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S0584853987800375; https://api.elsevier.com/content/article/PII:S0584853987800375?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0584853987800375?httpAccept=text/plain; http://linkinghub.elsevier.com/retrieve/pii/S0584853987800375; http://api.elsevier.com/content/article/PII:S0584853987800375?httpAccept=text/xml; http://api.elsevier.com/content/article/PII:S0584853987800375?httpAccept=text/plain; http://dx.doi.org/10.1016/s0584-8539%2887%2980037-5; https://dx.doi.org/10.1016/s0584-8539%2887%2980037-5
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