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Variable Angle Spectroscopic Ellipsometry investigation of CVD-grown monolayer graphene

Applied Surface Science, ISSN: 0169-4332, Vol: 467, Page: 213-220
2019
  • 38
    Citations
  • 0
    Usage
  • 30
    Captures
  • 0
    Mentions
  • 0
    Social Media
Metric Options:   Counts1 Year3 Year

Metrics Details

  • Citations
    38
    • Citation Indexes
      38
  • Captures
    30

Article Description

Despite intensive investigations in the UV (ultraviolet) and visible range, the research on the optical properties of graphene in the extended near and mid infrared range by means of Spectroscopic Ellipsometry (SE) remains limited yet. Herein, the optical properties of a Chemical Vapor Deposition (CVD)-grown monolayer graphene, transferred from a copper substrate onto SiO 2 /Si, were studied in the broad energy range (0.38–6.2 eV) using Variable Angle Spectroscopic Ellipsometry (VASE). The morphological and the structural properties of the samples were investigated by Micro-Raman Spectroscopy, Wavelength Dispersive X-ray (WDX) analysis, Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). The Lorentz oscillator model proposed for the optical response of graphene fits very well the experimental data. An unintentional doping, revealed by Micro-Raman Spectroscopy and WDX, is reported.

Bibliographic Details

Marco Castriota; Grazia Giuseppina Politano; Carlo Vena; Maria Penelope De Santo; Giovanni Desiderio; Mariano Davoli; Enzo Cazzanelli; Carlo Versace

Elsevier BV

Chemistry; Physics and Astronomy; Materials Science

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