Assessment of Cr doping on TiO 2 thin films deposited by a wet chemical method

Undoped and Cr-doped TiO 2 thin films were synthesized by the dip-coating sol-gel process with titanium isopropoxide and chromium (III) chloride hexahydrate being used as the precursors. The chromium concentrations changed for different molar ratios, namely, 2, 4, and 8 wt.%. The samples, coated on glass substrates, were later annealed in air at 450 °C for 60 min. The influence of Cr doping on the structural, surface chemical, and optical properties of the samples was studied by several techniques, including EDS, Raman, UV–Vis, RT-PL, and XPS spectroscopies, as well as SEM and XRD. The diffraction patterns indicated that all the films displayed the anatase structure with the crystallite size decreasing with chromium doping. The same structure was confirmed by Raman spectroscopy measurements. UV–Vis absorption spectra of the samples showed a red shift of the fundamental absorption edge in the visible range following the increase of Cr doping concentration. In addition, the RT-PL study revealed that the dopant incorporation causes a decrease in the PL intensity. The EDS analysis revealed the presence of Ti, O, and Cr in the materials. Moreover, from high-resolution XPS Ti 2p spectra, titanium was found to be in the Ti 4+ oxidation state evidencing the formation of TiO 2, while the Cr 2p fitting analysis showed that chromium is present in the Cr (III) and Cr-metal states.