Measurement and kinetic modeling on photoluminescence stability from “trenched” silicon microparticles under continuous excitation
Chemical Engineering Science, ISSN: 0009-2509, Vol: 138, Page: 9-16
2015
- 2Citations
- 4Captures
Metric Options: CountsSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
The stability of photoluminescence (PL) intensity from chemically etched silicon microparticles is studied. Etched microparticles have many narrow and deep trenches on surface. They show visible orange–red PL, which decreases in intensity during continuous excitation by ultraviolet light. The intensity of PL partially recovers when the surrounding gas is changed from air to nitrogen. Thus PL quenching consists of both reversible and irreversible processes and we propose a kinetic model that consists of two quenching paths. Adsorption and desorption of oxygen followed by irreversible oxidation of emission sites are considered in the fast quenching pathway, while the slow pathway involves transport of oxygen molecules to emission sites in trenches with poor access. Our model agrees well with experimental data and rate constants of involved processes are determined, with which we discuss kinetics in PL quenching. Possible strategy to increase PL stability is also discussed.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0009250915005254; http://dx.doi.org/10.1016/j.ces.2015.07.040; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=84939624642&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S0009250915005254; https://dx.doi.org/10.1016/j.ces.2015.07.040
Elsevier BV
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know