Optimization of the performance of CVD diamond electron multipliers
Diamond and Related Materials, ISSN: 0925-9635, Vol: 15, Issue: 4, Page: 827-832
2006
- 27Citations
- 21Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Aiming at the production of image-enhancing devices (electron multipliers) to amplify the backscattered electron signal in scanning electron microscopy, a study of the stationary secondary electron emission from CVD diamond films, irradiated by a high-energy primary electron beam, was performed in order to deepen the understanding of the specific material characteristics that appear to control the electronic emission. An extensive analysis of the secondary electron emission yield δ, as a function of the primary electron beam energy, was performed on polycrystalline CVD samples of different thickness. The emission yield was observed to increase up to a maximum value corresponding to a film thickness of about 15 μm and to decrease at larger thickness values. The experimental results are analyzed according to a theoretical model previously developed [P. Ascarelli, E. Cappelli, F. Pinzari, M.C. Rossi, S. Salvatori, P.G. Merli, A. Migliori, J. Appl. Phys. 89 (2001) 689] and extended within this work. We realized that the most important material parameter controlling the secondary electron emission yield as a function of the primary electron energy is the mean escape depth λ S of the secondary electrons. The obtained λ S values were found to be adequate to explain the film emission performance dependence on its thickness d. Moreover, using the atomic force microscopy technique and developing an algorithm based on a three-points method to identify the mean orientation of crystal facets in space, we observed that the λ S ( d ) (and consequently the secondary electron emission performance) evolution during the growth process may be largely explained by a variation of the film surface mean orientation and a concomitant variation of the film quality.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S0925963505006424; http://dx.doi.org/10.1016/j.diamond.2005.12.038; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=33745282924&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S0925963505006424; https://api.elsevier.com/content/article/PII:S0925963505006424?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0925963505006424?httpAccept=text/plain; https://dx.doi.org/10.1016/j.diamond.2005.12.038
Elsevier BV
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know