Surface defect detection methods for industrial products with imbalanced samples: A review of progress in the 2020s
Engineering Applications of Artificial Intelligence, ISSN: 0952-1976, Vol: 130, Page: 107697
2024
- 26Citations
- 62Captures
Metric Options: Counts1 Year3 YearSelecting the 1-year or 3-year option will change the metrics count to percentiles, illustrating how an article or review compares to other articles or reviews within the selected time period in the same journal. Selecting the 1-year option compares the metrics against other articles/reviews that were also published in the same calendar year. Selecting the 3-year option compares the metrics against other articles/reviews that were also published in the same calendar year plus the two years prior.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
Industrial products typically lack defects in smart manufacturing systems, which leads to an extremely imbalanced task of recognizing surface defects. With this imbalanced sample distribution, machine learning and deep learning algorithms preferentially learn features from the majority classes, potentially leading to inaccurate results. Addressing the issue of sample imbalance has thus emerged as a critical area of research within the field of industrial intelligent manufacturing. This paper discusses the imbalanced sample problem of industrial product surface defect detection algorithms, and proposes the existence of "four imbalances and two uncertainties". It also summarizes the industrial product surface dataset and innovatively adds the imbalance rate comparison to the dataset. In this study, data re-sampling, data expansion, feature extraction and identification, and re-weighting of category weights are elaborated at the level of data and algorithm respectively. Additionally, the paper explores prospective directions for future research, including supervised and unsupervised learning, transfer learning, anomaly detection, quality prediction, and future challenges. It is hoped to lay a solid foundation for the more far-reaching development of smart manufacturing and surface defect detection methods. And provide some directions for the research of sample imbalance and long-tail problems.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S095219762301881X; http://dx.doi.org/10.1016/j.engappai.2023.107697; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85180536404&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S095219762301881X; https://dx.doi.org/10.1016/j.engappai.2023.107697
Elsevier BV
Provide Feedback
Have ideas for a new metric? Would you like to see something else here?Let us know