Detecting the structural evolution of passive film induced by Shewanella oneidensis MR-1 using aberration-corrected TEM
Journal of Materials Science & Technology, ISSN: 1005-0302, Vol: 210, Page: 278-283
2025
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Example: if you select the 1-year option for an article published in 2019 and a metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019. If you select the 3-year option for the same article published in 2019 and the metric category shows 90%, that means that the article or review is performing better than 90% of the other articles/reviews published in that journal in 2019, 2018 and 2017.
Citation Benchmarking is provided by Scopus and SciVal and is different from the metrics context provided by PlumX Metrics.
Article Description
The formation of biofilm is generally known as a dominant factor for microbiologically influenced corrosion (MIC), and the mechanism of metal corrosion caused by microorganisms through extracellular electron transfer (EET) is widely recognized. Some investigations have discussed the interaction between bacteria and passive film, and oftentimes, not directly corroborated by experimental evidence. Here, we show the structural and compositional evolution of the passive films when interacting with Shewanella oneidensis MR-1. By means of aberration-corrected transmission electron microscope (Cs-corrected TEM) and electron energy loss spectrometer (EELS) analysis, we directly capture the loosening and locally thinning of the passive film induced by Shewanella oneidensis MR-1 and clarify that the passive film has undergone the electrochemical reducing process. This work provides new insights into the EET mechanism between microorganisms and metals.
Bibliographic Details
http://www.sciencedirect.com/science/article/pii/S1005030224006418; http://dx.doi.org/10.1016/j.jmst.2023.10.066; http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=85196397915&origin=inward; https://linkinghub.elsevier.com/retrieve/pii/S1005030224006418; https://dx.doi.org/10.1016/j.jmst.2023.10.066
Elsevier BV
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